AEI’s laboratories provide the proper environment for experts to conduct benchtop component testing and full-scale equipment testing. This approach allows the recreation of incident scenarios to collect scientific data supporting or refuting a hypothesis related to a loss. Test data can be invaluable in resolving claims, negotiating settlements, and informing juries. Should a case proceed to litigation, AEI’s experts are ready and experienced in providing expert witness testimony.
FTIR stands for Fourier Transform Infrared Spectroscopy. This technology is useful in identifying organic materials, compounds and polymers. Different materials have unique combinations of components. The FTIR can assist in identifying what those components are, and sometimes whether or not those components have been degraded or contaminated.
The Keyence microscope can be a core component in performing failure analysis. These microscopes are capable of producing 3D images with extremely high accuracy. That image can then be examined, manipulated and measurements can be taken. This technology helps to preserve the artifact, while still collecting critical information and allowing for analysis.
FLIR, Forward Looking Infrared Radiometer, is technology that provides a visual presentation of the temperature of objects during movement or stasis. The use of infrared technology provides visual, color coded mapping of temperatures at various locations on the item of interest. The FLIR assists in pinpointing hot spots and areas for examination that may not be visible otherwise.
The portable X-Ray is another tool that can be utilized for non-destructive testing of artifacts. Use of the X-Ray allows our experts to see inside a key electronic component, appliance, etc., to determine if the origin and cause of a fire, or other incident, may be related to an internal aspect of that artifact.